Insights into Semiconductor Technology, Measurement and Modeling
Explore practical technical articles on semiconductor technology, noise, measurement, reliability, modeling and simulation: from fundamental physics to modern devices and applications.
Latest Articles
Beyond the 1/f spectrum: Influence of flicker noise on RF Circuits
Low-frequency noise is often associated with slowly varying electrical fluctuations, seemingly far removed from the operating frequencies of modern analog and RF circuits. However, its...
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The New Frontiers of Nanoscale Semiconductor Technology
For decades, semiconductor progress was driven by continuously shrinking transistor dimensions, initially supported by the principles of Dennard scaling. This approach enabled higher...
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The Landscape of Semiconductor Modeling and Simulation
Modern electronic systems span an enormous range of scales, from physical processes inside individual semiconductor devices to the behavior of complete electronic systems. No single model can...
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Measurement & Characterization
Methods and systems for precise characterization of electronic devices.
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Reliability & Variability
Defects, aging, and variability in modern semiconductor devices.
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Modeling & Simulation
From device physics and circuit modeling to system-level simulation.
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Emerging Semiconductor Technologies
New devices, materials, and concepts for future technologies.
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